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| File | File in archive | Date | Context | Size | DLs | Mfg | Model |
| Optoelectronic IC Component Evaluation 5991-0015EN c20130528 [2].pdf | Optoelectronic IC Component Evaluation 5991-0015EN c20130528 [2].pdf | 29/09/19 | 281 kB | 4 | Agilent | Optoelectronic IC Component Evaluation 5991-0015EN c20130528 [2] | |
| MEMS Accelerometer Evaluation 5991-0573EN c20141029 [2].pdf | MEMS Accelerometer Evaluation 5991-0573EN c20141029 [2].pdf | 31/08/20 | Product Fact Sheet Keysight Technologies | 287 kB | 1 | Agilent | MEMS Accelerometer Evaluation 5991-0573EN c20141029 [2] |
| N4376B Lightwave Component Analyzer - User_2527s Guide - Manual Changes Supplement 5991-3001EN [3].p | N4376B Lightwave Component Analyzer - User_2527s Guide - Manual Changes Supplement 5991-3001EN [3].p | 24/06/21 | Manual Changes Supplement ______________ | 117 kB | 1 | Agilent | N4376B Lightwave Component Analyzer - User 2527s Guide - Manual Changes Supplement 5991-3001EN [3] |
| N4375B Lightwave Component Analyzer - User_2527s Guide - Manual Changes Supplement 5991-3000EN [5].p | N4375B Lightwave Component Analyzer - User_2527s Guide - Manual Changes Supplement 5991-3000EN [5].p | 07/06/21 | Manual Changes Supplement ______________ | 187 kB | 2 | Agilent | N4375B Lightwave Component Analyzer - User 2527s Guide - Manual Changes Supplement 5991-3000EN [5] |
| 1986_Optoelectronics_Designers_Catalog.pdf.pdf | 1986_Optoelectronics_Designers_Catalog.pdf.pdf | 21/03/20 | To help you in choosing and designing wi | 68763 kB | 1 | HP | 1986 Optoelectronics Designers Catalog.pdf |
| xscalepxa270.pdf | xscalepxa270.pdf | 13/03/20 | Embest XScale PXA27 | 336 kB | 0 | Embest | xscalepxa270 |
| 1979_Optoelectronics_Designers_Catalog.pdf | 1979_Optoelectronics_Designers_Catalog.pdf | 14/09/19 | HEWLETT 11 = P | 36189 kB | 1 | HP | 1979_Optoelectronics_Designers_Catalog |
| 1980_Optoelectronics_Designers_Catalog.pdf | 1980_Optoelectronics_Designers_Catalog.pdf | 08/12/19 | \ I. . ~.. I | 54121 kB | 9 | HP | 1980 Optoelectronics Designers Catalog |
| XScalePxa255.pdf | XScalePxa255.pdf | 02/11/19 | Embest XScale PXA255 Eva | 480 kB | 0 | Embest | XScalePxa255 |
| 1977_Optoelectronics_Designers_Catalog.pdf | 1977_Optoelectronics_Designers_Catalog.pdf | 07/02/20 | Hewlett- Packard 'Componen~s A decade of | 24243 kB | 3 | HP | 1977 Optoelectronics Designers Catalog |
| 5980-2862EN.pdf | 5980-2862EN.pdf | 22/03/20 | Agilent Solutions for Measuring Permitti | 1536 kB | 3 | HP | 5980-2862EN |
| stdv750-1.pdf | stdv750-1.pdf | 31/12/19 | Embest STDV750F Eval | 908 kB | 1 | Embest | stdv750-1 |
| 5991-3520EN Contact Deformation of LiNbO3 Single Crystal_Dislocations_252C Twins and Ferroelectric D | 5991-3520EN Contact Deformation of LiNbO3 Single Crystal_Dislocations_252C Twins and Ferroelectric D | 17/10/21 | Contact Deformation of LiNbO3 Single Cry | 752 kB | 3 | Agilent | 5991-3520EN Contact Deformation of LiNbO3 Single Crystal Dislocations 252C Twins and Ferroelectric D |
| 5991-3578EN HBT Prescaler Evaluation Board - Technical Overview c20140718 [2].pdf | 5991-3578EN HBT Prescaler Evaluation Board - Technical Overview c20140718 [2].pdf | 25/08/20 | Keysight Technologies HBT Prescaler Eval | 998 kB | 2 | Agilent | 5991-3578EN HBT Prescaler Evaluation Board - Technical Overview c20140718 [2] |
| 5991-3119EN DC-DC Converter Evaluation - Flyer c20141001 [3].pdf | 5991-3119EN DC-DC Converter Evaluation - Flyer c20141001 [3].pdf | 21/11/19 | Keysight Technologies B2900A Serie | 1160 kB | 8 | Agilent | 5991-3119EN DC-DC Converter Evaluation - Flyer c20141001 [3] |
| 5991-4710EN 2014 Global PXI Instrumentation Growth Excellence Leadership Award - Article Reprint [16 | 5991-4710EN 2014 Global PXI Instrumentation Growth Excellence Leadership Award - Article Reprint [16 | 20/08/21 | Keysight Technologies 2014 Global PXI In | 675 kB | 3 | Agilent | 5991-4710EN 2014 Global PXI Instrumentation Growth Excellence Leadership Award - Article Reprint [16 |
| SMU (Source Measure Unit) for ICs and Electronic Components 5990-9870EN c20130528 [2].pdf | SMU (Source Measure Unit) for ICs and Electronic Components 5990-9870EN c20130528 [2].pdf | 26/08/20 | 406 kB | 4 | Agilent | SMU (Source Measure Unit) for ICs and Electronic Components 5990-9870EN c20130528 [2] | |
| CSL-83-9_The_Semantics_of_Lazy_And_Industrious_Evaluation.pdf | CSL-83-9_The_Semantics_of_Lazy_And_Industrious_Evaluation.pdf | 18/03/20 | The Semantics of Lazy (And Industrious | 2276 kB | 0 | xerox | CSL-83-9 The Semantics of Lazy And Industrious Evaluation |
| 5980-2862EN Solutions for Measuring Permittivity and Permeability w LCR Meters & Impedance Analyzers | 5980-2862EN Solutions for Measuring Permittivity and Permeability w LCR Meters & Impedance Analyzers | 15/09/21 | Keysight Technologies Solutions for Meas | 718 kB | 4 | Agilent | 5980-2862EN Solutions for Measuring Permittivity and Permeability w LCR Meters & Impedance Analyzers |
| stdv711f.pdf | stdv711f.pdf | 07/02/20 | STDV711F Evaluat | 198 kB | 0 | Embest | stdv711f |